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Timeline
Chapter title |
FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification
|
---|---|
Chapter number | 16 |
Book title |
Artificial Neural Networks and Machine Learning – ICANN 2023
|
Published by |
Springer, Cham, January 2023
|
DOI | 10.1007/978-3-031-44207-0_16 |
Book ISBNs |
978-3-03-144206-3, 978-3-03-144207-0
|
Authors |
Deng, Shisheng, Liao, Dongping, Gao, Xitong, Zhao, Juanjuan, Ye, Kejiang |