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Timeline
Mendeley readers
Chapter title |
Advanced Material Characterization by TOFSIMS in Microelectronic
|
---|---|
Chapter number | 35 |
Book title |
Materials for Information Technology
|
Published by |
Springer, London, January 2005
|
DOI | 10.1007/1-84628-235-7_35 |
Book ISBNs |
978-1-85233-941-8, 978-1-84628-235-5
|
Authors |
T. Conard, W. Vandervorst |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 5 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 2 | 40% |
Librarian | 1 | 20% |
Student > Doctoral Student | 1 | 20% |
Unknown | 1 | 20% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 2 | 40% |
Engineering | 1 | 20% |
Unknown | 2 | 40% |