Genome-Wide Association Analysis of Stable Stripe Rust Resistance Loci in a Chinese Wheat Landrace Panel Using the 660K SNP Array

Overview of attention for article published in Frontiers in Plant Science, December 2021

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Genome-Wide Association Analysis of Stable Stripe Rust Resistance Loci in a Chinese Wheat Landrace Panel Using the 660K SNP Array https://t.co/l2FwbSx8nx https://t.co/Y94V4SdAyU

18 Jan 2022

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New Research: Genome-Wide Association Analysis of Stable Stripe Rust Resistance Loci in a Chinese Wheat Landrace Panel Using the 660K SNP Array: Stripe rust (caused by Puccinia striiformis f. sp. tritici) is one of the most severe… https://t.co/CrzYeL8GhE

22 Dec 2021

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