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X Demographics
Title |
Estudio de Confiabilidad en Diodos Basados en AlGaN/GaN Durante el Estado de Encendido
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Published in |
Revista Politécnica, May 2022
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DOI | 10.33333/rp.vol50n1.03 |
Authors |
Eliana Acurio, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot |
X Demographics
Geographical breakdown
Country | Count | As % |
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Ecuador | 1 | 100% |
Demographic breakdown
Type | Count | As % |
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Members of the public | 1 | 100% |