Investigating charge trapping in ferroelectric thin films through transient measurements

Overview of attention for article published in Frontiers in Nanotechnology, August 2022

Altmetric Badge

About this Attention Score

Average Attention Score compared to outputs of the same age
Good Attention Score compared to outputs of the same age and source (79th percentile)

Mentioned by

twitter: 4 X users

Citations

dimensions_citation: 21 Dimensions

Readers on

mendeley: 25 Mendeley

Summary X Dimensions citations

So far, Altmetric has seen 4 X posts from 4 X users, with an upper bound of 8,583 followers.

Frontiers in #Nanotechnology celebrates its 5-year anniversary! Explore our research spotlight: Investigating charge trapping in ferroelectric thin films through transient measurements Read more ⬇️ https://t.co/uk4KGUko78

12 Sep 2024

Reply Repost Favourite

Charge trapping in the interfacial dielectric layer plays an important role in the polarization reliability of ferroelectric memories. Thanks to the group of @TMikolajick for this work! https://t.co/2VZ0WITVV4

20 Jun 2023

Reply Repost Favourite

New Research: Investigating charge trapping in ferroelectric thin films through transient measurements https://t.co/CpH7gk71qE #nanotechnology

17 Aug 2022

Reply Repost Favourite

[2206.14593] Suzanne Lancaster, Patrick D Lomenzo, Moritz Engl et al.: Investigating charge trapping in ferroelectric thin films through transient measurements https://t.co/8m8BjxYtur https://t.co/HmyS3TqiLX #cond_mat_mtrl_sci

30 Jun 2022

Reply Repost Favourite

This page shows the most recent X posts that mention this research output.

Click here to find out how to access more activity.