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Formal Methods for Industrial Critical Systems

Overview of attention for book
Attention for Chapter 13: Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation
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2 Mendeley
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Chapter title
Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation
Chapter number 13
Book title
Formal Methods for Industrial Critical Systems
Published in
Lecture notes in computer science, January 2014
DOI 10.1007/978-3-319-10702-8_13
Book ISBNs
978-3-31-910701-1, 978-3-31-910702-8
Authors

Campbell, Brian, Stark, Ian, Brian Campbell, Ian Stark

Editors

Lang, Frédéric, Flammini, Francesco

Timeline

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Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 2 100%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 1 50%
Student > Master 1 50%
Readers by discipline Count As %
Computer Science 1 50%
Engineering 1 50%