Intelligent Technologies and Engineering Systems
Springer New York
Chapter title |
Simultaneous Thickness Measurement and Material Composition Analysis Using X-Ray Fluorescence Technique
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Chapter number | 101 |
Book title |
Intelligent Technologies and Engineering Systems
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Published by |
Springer, New York, NY, January 2013
|
DOI | 10.1007/978-1-4614-6747-2_101 |
Book ISBNs |
978-1-4614-6746-5, 978-1-4614-6747-2
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Authors |
Hsiao-Wen Wu, Xuan-Loc Nguyen, Wu, Hsiao-Wen, Nguyen, Xuan-Loc |