Grating Projection System for Profiling with the Aid of Fringe Scanning Method

Overview of attention for article published in Journal of the Japan Society for Precision Engineering, January 1989

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Among the highest-scoring outputs from this source (#36 of 324)

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So far, Altmetric has seen 2 patents that reference this research output.

Three-dimensional shape measurement technique

Grant US-7315643-B2

United States of America

Three-dimensional shape measurement method and apparatus and computer program product

Grant US-6421629-B1

United States of America

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