Methodology for Photovoltaic Modules Characterization and Shading Effects Analysis

Overview of attention for article published in Journal of the Brazilian Society of Mechanical Sciences, March 2002

Altmetric Badge

Mentioned by

patent: 1 patent

Citations

dimensions_citation: 18 Dimensions

Readers on

mendeley: 32 Mendeley

Summary Patents Dimensions citations

So far, Altmetric has seen 1 patent that references this research output.

SYSTEM FOR MEASURING THE VOLTAGE-CURRENT CURVE IN PHOTOVOLTAIC MODULES

Application WO-2012028751-A1

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output.

Click here to find out how to access more activity.