Robust Pattern Generation for Small Delay Faults Under Process Variations
Conference proceeding (October 2023)
Test and Diagnosis for Small-Delay Defects
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 Introduction to VLSI Testing
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Altmetric BadgeChapter 2 Delay Test and Small-Delay Defects
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Altmetric BadgeChapter 3 Long Path-Based Hybrid Method
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Altmetric BadgeChapter 4 Process Variations- and Crosstalk-Aware Pattern Selection
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Altmetric BadgeChapter 5 Power Supply Noise- and Crosstalk-Aware Hybrid Method
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Altmetric BadgeChapter 6 SDD-Based Hybrid Method
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Altmetric BadgeChapter 7 Maximizing Crosstalk Effect on Critical Paths
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Altmetric BadgeChapter 8 Maximizing Power Supply Noise on Critical Paths
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Altmetric BadgeChapter 9 Faster-Than-At-Speed Test
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Altmetric BadgeChapter 10 Introduction to Diagnosis
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Altmetric BadgeChapter 11 Diagnosing Noise-Induced SDDs by Using Dynamic SDF
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Citations
- dimensions_citation
- 26 Dimensions