Fringe 2009
Springer Berlin Heidelberg
Chapter title |
Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures
|
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Chapter number | 40 |
Book title |
Fringe 2009
|
Published by |
Springer, Berlin, Heidelberg, January 2009
|
DOI | 10.1007/978-3-642-03051-2_40 |
Book ISBNs |
978-3-64-203050-5, 978-3-64-203051-2
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Authors |
Peter de Groot, Xavier Colonna de Lega, Jan Liesener, de Groot, Peter, Colonna de Lega, Xavier, Liesener, Jan |
Country | Count | As % |
---|---|---|
United Kingdom | 2 | 6% |
Denmark | 1 | 3% |
Unknown | 28 | 90% |
Readers by professional status | Count | As % |
---|---|---|
Researcher | 11 | 35% |
Student > Ph. D. Student | 7 | 23% |
Professor | 2 | 6% |
Student > Master | 2 | 6% |
Student > Bachelor | 1 | 3% |
Other | 2 | 6% |
Unknown | 6 | 19% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 11 | 35% |
Physics and Astronomy | 10 | 32% |
Materials Science | 1 | 3% |
Computer Science | 1 | 3% |
Unknown | 8 | 26% |